Items where Author is "Naik, P. S."

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Praveen, K. C. and Pushpa, N. and Naik, P. S. and Cressler, J. D. and Shiva, H. B. and Verma, S. and Tripathi, A. and Gnana Prakash, A. P. (2013) In situ investigation of 75 MeV boron and 100 MeV oxygen ion irradiation effects on 50 GHz silicon-germanium heterojunction bipolar transistors. Radiation Effects and Defects in Solids, 168 (7-8). pp. 620-624. ISSN 1042-0150

Praveen, K. C. and Pushpa, N. and Naik, P. S. and Cressler, John D. and Tripathi, Ambuj and Gnana Prakash, A. P. (2012) Application of a Pelletron accelerator to study total dose radiation effects on 50GHz SiGe HBTs. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 273. 43 - 46. ISSN 0168-583X

Gnana Prakash, A. P. and Pushpa, N. and Praveen, K. C. and Naik, P. S. and Revannasiddaiah, D. (2012) Evaluation of pelletron accelerator facility to study radiation effects on semiconductor devices. AIP Conference Proceedings, 1447 (1). pp. 489-490. ISSN 1551-7616

Pushpa, N. and Praveen, K. C. and Gnana Prakash, A. P. and Naik, P. S. and Cressler, John D. and Gupta, S. K. and Revannasiddaiah, D. (2012) Reliability studies on NPN RF power transistors under swift heavy ion irradiation. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 273. 36 - 39. ISSN 0168-583X

Pushpa, N. and Praveen, K. C. and Gnana Prakash, A. P. and Naik, P. S. and Tripathi, Ambuj and Gupta, S. K. and Revannasiddaiah, D. (2012) The effect of swift heavy ion irradiation on threshold voltage, transconductance and mobility of DMOSFETs. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 273. 40 - 42. ISSN 0168-583X

Pushpa, N. and Praveen, K. C. and Gnana Prakash, A. P. and Naik, P. S. and Gupta, S. K. and Revannasiddaiah, D. (2012) The influence of 175 MeV Ni13+ ion and Co-60 gamma irradiation effects on subthreshold characteristics of N-channel depletion MOSFETs. AIP Conference Proceedings, 1447 (1). pp. 1043-1044. ISSN 1551-7616

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