Divakara, S. and Madhu, S. and Somashekar, R. (2009) Stacking faults and microstructural parameters in non-mulberry silk fibres. PRAMANA-JOURNAL OF PHYSICS, 73 (5). pp. 927-938. ISSN 0973-7111
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Official URL: http://doi.org/10.1007/s12043-009-0159-8
Abstract
We have analysed the broadening of X-ray reflections observed in non-mulberry silk fibres in terms of stacking faults and microstructural parameters using a single-order method and have, with these parameters, developed, for the first time, a procedure to compute the whole pattern of these silk fibres. The essential deviations in the values of microstructural parameters obtained from line profile and whole pattern fitting procedures are discussed in this paper.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | Stacking; crystallite size; fibres |
| Subjects: | D Physical Science > Physics |
| Divisions: | Department of > Physics |
| Depositing User: | Users 19 not found. |
| Date Deposited: | 14 Aug 2019 09:48 |
| Last Modified: | 14 Aug 2019 09:48 |
| URI: | http://eprints.uni-mysore.ac.in/id/eprint/6381 |
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