Characterization of white and red teff grains using X-ray technique

Hagos, Kiros and Jayanth, C. V. and Somashekar, R. (2012) Characterization of white and red teff grains using X-ray technique. Journal of Scientific and Industrial Research, 71 (8). pp. 534-538. ISSN 0022-4456

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Official URL: http://nopr.niscair.res.in/handle/123456789/14522

Abstract

This study presents X-ray studies to investigate effect of microwave radiation and solvent treatment of white and red teff grains normally grown in Ethiopia. Studies were correlated for a better understanding of these grains.

Item Type: Article
Subjects: D Physical Science > Physics
Divisions: Department of > Physics
Depositing User: C Swapna Library Assistant
Date Deposited: 18 Jul 2019 05:09
Last Modified: 18 Jul 2019 05:09
URI: http://eprints.uni-mysore.ac.in/id/eprint/5323

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