Microstructural parameters in electron-irradiated C108 silk fibers by wide-angle X-ray scattering studies

Sangappa and Asha, S. and Sanjeev, Ganesh and Subramanya, G. and Parameswara, P. and Somashekar, R. (2010) Microstructural parameters in electron-irradiated C108 silk fibers by wide-angle X-ray scattering studies. Journal of Applied Polymer Science, 115 (4). pp. 2183-2189. ISSN 1097-4628

Text (Full Text) Microstructural Parameters in Electron-Irradiated C108 Silk.pdf - Published Version Restricted to Registered users only Download (252kB) | Request a copy

Abstract

Abstract The present study looks into the microstructural changes in C108 (Bombyx mori) silk fibers, induced by electron irradiation. The irradiation process was performed in air at room temperature by the use of 8 MeV electron accelerators at different doses: 0, 25, 50, 75, and 100 kGy, respectively. The changes in microstructural parameters in these natural polymer fibers have been studied using wide-angle X-ray scattering method. The crystal imperfection parameters such as crystallite size 〈N〉, lattice strain (g in %), and enthalpy (α*) have been determined by line profile analysis using Fourier method of Warren. Exponential, lognormal, and Reinhold functions for the column length distributions have been used for the determination of these parameters. © 2009 Wiley Periodicals, Inc. J Appl Polym Sci, 2010

Item Type:	Article
Uncontrolled Keywords:	irradiation, microstructural parameters, WAXS, fiber
Subjects:	B Life Science > Sericulture D Physical Science > Physics
Divisions:	Department of > Sericulture Science
Depositing User:	LA manjunath user
Date Deposited:	16 Jul 2019 05:01
Last Modified:	16 Jul 2019 05:01
URI:	http://eprints.uni-mysore.ac.in/id/eprint/5225

Actions (login required)

View Item