Annadurai, V. and Subramanyam, G. and Urs, R. G. and Somashekar, R. (2000) Structure-property relation in varieties of silk fibers. Journal of Applied Polymer Science, 79 (11). pp. 1979-1985.
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1097-4628(20010314)79_11_1979__AID-APP1005_3.0.CO;2-Y.pdf Download (192kB) |
Official URL: https://doi.org/10.1002/1097-4628(20010314)79:11<1...
Abstract
Crystallite shape ellipsoid in different varieties of silk fibers namely (i) Chinese (ii) Indian, and (iii) Japanese, has been computed using wide-angle X-ray data and Hosemann's one-dimensional paracrystalline model. The estimated microcrystalline parameters are correlated with the observed physical property of the silk fibers. (C) 2001 John Wiley & Sons, Inc.
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | silk fibers; paracrystalline model; wide-angle X-ray data |
| Divisions: | Department of > Physics |
| Depositing User: | Harisha R uom |
| Date Deposited: | 29 Mar 2021 05:10 |
| Last Modified: | 29 Mar 2021 06:04 |
| URI: | http://eprints.uni-mysore.ac.in/id/eprint/10116 |
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