Items where Author is "Shobhad, V."

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Vinay Kumara, M. and Verma, Shammi and Asokan, K. and Shobhad, V. and Karanth, S. P. and Krishnavenia, S. (2016) In situ electrical characteristics of 150 mev ag9+ ion beam induced damage in SI photo detector. ECS Journal of Solid State Science and Technology, 5 (2). pp. 384-388.

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