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Arshiya Anjum and Vinayakprasanna, N. H. and Pradeep, T. M. and Pushpa, N. and Krishna, J. B. M. and Gnana Prakash, A. P. (2016) A comparison of 4MeV Proton and Co-60 gamma irradiation induced degradation in the electrical characteristics of N-channel MOSFETs. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 379. 265 - 271.