Effect of 100 keV N + ion irradiation on the organic single crystal of hippuric acid for nonlinear optical applications

Rani, N. and Vijayan, N. and Jat, S. K. and Maurya, K. K. and Kumar, P. and Gnana Prakash, A. P. and Bhagavannarayana, G. and Wahab, M. A. (2013) Effect of 100 keV N + ion irradiation on the organic single crystal of hippuric acid for nonlinear optical applications. Radiation Effects and Defects in Solids, 168 (9). pp. 705-716. ISSN 1042-0150

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Official URL: http://doi.org/10.1080/10420150.2013.771355

Abstract

The potential organic nonlinear optical material of hippuric acid (HA) single crystal has been grown by the slow evaporation solution growth technique using N, N-dimethylformamide as the solvent. Single crystals of pure HA were irradiated at room temperature with 100 keV Nitrogen (N + ) ions at fluence 1�10 16 and 5�10 16 ions/cm 2 . The pure and irradiated HA single crystals were characterized by different characterization technique. The photoluminescence and UV-visible absorption were performed at room temperature. The crystalline perfection of the pure and irradiated single crystals has been examined by high-resolution X-ray diffraction. Vickers microhardness technique was used to study the effect on the mechanical strength of the crystal at different ion fluences. The structural changes were analyzed by powder X-ray diffraction analysis. The functional groups of the synthesized compound have been identified by Fourier transform infrared spectroscopy. The dielectric constant and dielectric loss as a function of frequency were analyzed at room temperature.

Item Type: Article
Uncontrolled Keywords: Amino acids, Irradiation, Single crystals, Fourier transform infrared spectroscopy, Ions, Powder X ray diffraction, Functional groups, Non-linear optical material, Optical materials, Characterization techniques, Dielectric losses, High resolution X ray diffraction, Nonlinear optical applications, Organic nonlinear optical materials, Semiconductor quantum wells, Solution growth, Solution growth technique, X ray diffraction analysis
Subjects: D Physical Science > Physics
Divisions: Department of > Physics
Depositing User: Arshiya Kousar
Date Deposited: 31 Oct 2019 07:34
Last Modified: 31 Oct 2019 07:34
URI: http://eprints.uni-mysore.ac.in/id/eprint/9660

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