Guru, D. S. and Kiranagi, B. B. (2005) Multivalued type dissimilarity measure and concept of mutual dissimilarity value for clustering symbolic patterns. Pattern Recognition, 38 (1). 151 - 156. ISSN 0031-3203
Text (Full Text)
Multivalued type dissimilarity measure.pdf - Published Version Restricted to Registered users only Download (105kB) | Request a copy |
Abstract
A successful attempt in exploring a dissimilarity measure which captures the reality is made in this paper. The proposed measure unlike other measures (Pattern Recognition 24(6) (1991) 567; Pattern Recognition Lett. 16 (1995) 647; Pattern Recognition 28(8) (1995) 1277; IEEE Trans. Syst. Man Cybern. 24(4) (1994)) is multivalued and non-symmetric. The concept of mutual dissimilarity value is introduced to make the existing conventional clustering algorithms work on the proposed unconventional dissimilarity measure.
Item Type: | Article |
---|---|
Uncontrolled Keywords: | Symbolic patterns, Dissimilarity measure, Multivalued data type, Mutual dissimilarity value, Clustering of symbolic patterns |
Subjects: | D Physical Science > Computer Science |
Divisions: | Department of > Computer Science |
Depositing User: | Manjula P Library Assistant |
Date Deposited: | 09 Sep 2019 11:31 |
Last Modified: | 09 Sep 2019 11:31 |
URI: | http://eprints.uni-mysore.ac.in/id/eprint/7881 |
Actions (login required)
View Item |