The reliability studies of Nano-Engineered SiGe HBTs using pelletron accelerator

Gnana Prakash, A. P. and Praveen, K. C. and Pushpa, N. and Cressler John, D. (2015) The reliability studies of Nano-Engineered SiGe HBTs using pelletron accelerator. AIP Conference Proceedings, 1661 (1).

Full text not available from this repository. (Request a copy)
Item Type: Article
Subjects: D Physical Science > Physics
Divisions: Department of > Physics
Depositing User: Shrirekha N
Date Deposited: 05 Jul 2019 10:55
Last Modified: 05 Jul 2019 10:55
URI: http://eprints.uni-mysore.ac.in/id/eprint/4784

Actions (login required)

View Item View Item