Gnana Prakash, A. P. and Praveen, K. C. and Pushpa, N. and Cressler John, D. (2015) The reliability studies of Nano-Engineered SiGe HBTs using pelletron accelerator. AIP Conference Proceedings, 1661 (1).
Full text not available from this repository. (Request a copy)| Item Type: | Article |
|---|---|
| Subjects: | D Physical Science > Physics |
| Divisions: | Department of > Physics |
| Depositing User: | Users 19 not found. |
| Date Deposited: | 05 Jul 2019 10:55 |
| Last Modified: | 05 Jul 2019 10:55 |
| URI: | http://eprints.uni-mysore.ac.in/id/eprint/4784 |
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