X-ray photoelectron spectroscopic studies of CdS semiconductor thin films deposited by photochemical deposition

Pushpalatha, H. L. and Ganesha, R. (2014) X-ray photoelectron spectroscopic studies of CdS semiconductor thin films deposited by photochemical deposition. International Journal of ChemTech Research, 7 (5). pp. 2171-2175. ISSN 0974-4290

Text (Full Text) YCM_Phy_2014_Pushpalatha_02.pdf - Published Version Restricted to Registered users only Download (272kB) | Request a copy

Abstract

Cadmium sulphide (CdS) thin films were deposited on insulating glass substrates from an acidic solution using cadmium sulphate (CdSO\textlessinf\textgreater4\textless/inf\textgreater) and sodium thiosulfate (Na\textlessinf\textgreater2\textless/inf\textgreaterS\textlessinf\textgreater2\textless/inf\textgreaterO\textlessinf\textgreater3\textless/inf\textgreater) by photochemical deposition (PCD). Analysis by X-ray photoelectron spectroscopy (XPS) giving a greater insight into the chemical composition through peaks corresponding to excitation of different electronic energy levels and correlation of the calculated chemical shifts is presented in this paper.

Item Type:	Article
Uncontrolled Keywords:	Article, unclassified drug, X ray diffraction, scanning electron microscopy, surface property, ultraviolet spectrophotometry, X ray photoelectron spectroscopy, carbon, chemical analysis, Raman spectrometry, oxygen, cadmium, photochemistry, film, cadmium derivative, cadmium sulfate, cadmium sulphide, Cadmium sulphide film, photochemical deposition, photoluminescence, semiconductor, sodium thiosulfate, sulfur, ultraviolet irradiation
Subjects:	D Physical Science > Physics
Divisions:	Yuvaraj college > Physics
Depositing User:	Arshiya Kousar Library Assistant
Date Deposited:	27 Aug 2019 05:46
Last Modified:	27 Aug 2019 05:46
URI:	http://eprints.uni-mysore.ac.in/id/eprint/4374

Actions (login required)

View Item