Electron beam induced microstructural changes and electrical conductivity in bakelite polymer rpc detector material: a positron lifetime study

Aneesh Kumar, K. V. and Ningaraju, S. and Munirathnamma, L. M. and Ravikumar, H. B. and Ranganathaiah, C. (2015) Electron beam induced microstructural changes and electrical conductivity in bakelite polymer rpc detector material: a positron lifetime study. Journal of Physics: Conference Series, 618 (1). 012032.

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Official URL: http://doi.org/10.1088/1742-6596/618/1/012032

Abstract

In order to explore the structural modification induced electrical conductivity, samples of Bakelite RPC polymer detector materials were exposed to 8 MeV of electron beam with the irradiation dose from 20 kGy to100 kGy in steps of 20 kGy. The microstructural changes upon electron beam irradiation have been studied using Positron Annihilation Lifetime Spectroscopy (PALS) and Fourier Transform Infrared (FTIR) Spectroscopy. Positron lifetime parameters viz., o-Ps lifetime and its intensity show chain scission at lower doses (20 kGy, 40 kGy) followed by cross-linking beyond 40 kGy due to the radical reactions. The reduction in electrical conductivity of Bakelite material beyond 60 kGy is correlated to the conducting pathways and cross-links in the polymer matrix. The appropriate doses of electron beam irradiation of Bakelite material may reduce the leakage current and hence improves the performance of the detector

Item Type: Article
Subjects: D Physical Science > Physics
Divisions: Department of > Physics
Depositing User: Shrirekha N
Date Deposited: 01 Jul 2019 07:05
Last Modified: 01 Jul 2019 07:05
URI: http://eprints.uni-mysore.ac.in/id/eprint/4246

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