Gnana Prakash, A. P. and Pradeep, T. M. and Hegde, Vinayakprasanna N. and Pushpa, N. and Bajpai, P. K. and Patel, S. P. and Trivedi, Tarkeshwar and Bhushan, K. G. (2017) Comparison of effect of 5 MeV proton and Co-60 gamma irradiation on silicon NPN rf power transistors and N–channel depletion MOSFETs. Radiation Effects and Defects in Solids, 172 (11-12). pp. 952-963. ISSN 1029-4953
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Comparison of effect of 5 MeV proton and Co-60gamma irradiation on silicon NPN rf powertransistors and N–channel depletion MOSFETs.pdf - Published Version Restricted to Registered users only Download (2MB) | Request a copy |
Abstract
NPN transistors and N-channel depletion metal oxide semiconductor field effect transistors (MOSFETs) were irradiated with 5 MeV protons and 60Co gamma radiation in the dose ranging from 1 Mrad(Si) to 100 Mrad(Si). The different electrical characteristics of the NPN transistor such as Gummel characteristics, excess base current (ΔIB), dc current gain (hFE), transconductance (gm), displacement damage factor (K) and output characteristics were studied as a function of total dose. The different electrical characteristics of N-channel MOSFETs such as threshold voltage (Vth), density of interface trapped charges (ΔNit), density of oxide trapped charges (ΔNot), transconductance (gm), mobility (µ) and drain saturation current (IDSat) were studied systematically before and after irradiation in the same dose ranges. A considerable increase in the base current (IB) and decrease in the hFE, gm and collector saturation current (ICSat) were observed after irradiation in the case of the NPN transistor. In the N-channel MOSFETs, the ΔNit and ΔNot were found to increase and Vth, gm, µ and IDSat were found to decrease with increase in the radiation dose. The 5 MeV proton irradiation results of both the NPN transistor and N-channel MOSFETs were compared with 60Co gamma-irradiated devices in the same dose ranges. It was observed that the degradation in 5 MeV proton-irradiated devices is more when compared with the 60Co gamma-irradiated devices at higher total doses.
Item Type: | Article |
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Subjects: | D Physical Science > Physics |
Divisions: | Department of > Physics |
Depositing User: | C Swapna Library Assistant |
Date Deposited: | 26 Jun 2019 05:53 |
Last Modified: | 04 Nov 2019 10:26 |
URI: | http://eprints.uni-mysore.ac.in/id/eprint/3863 |
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