Sankarshan, B. M. and Athrey, C. D. and Umesh, T. K. (2017) Determination of the effective atomic number of thick samples of unknown composition using scattering studies. The European Physical Journal Plus, 132 (6). p. 271. ISSN 2190-5444
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Abstract
The effective atomic number ( $ Z_{\backslashrm eff}$Zeff is a quantity which gives the fraction of the total number of electrons in a composite material participating in the photon-atom interaction. The effective atomic number has been determined for the materials of known composition by using different methods. However, no method has been reported so far to determine $ Z_{\backslashrm eff}$Zeff for thick samples of unknown composition. In view of this, we have evolved a simple method to determine the effective atomic number, which uses the scattering intensity ratios measured at two scattering angles, in which a sample of known $ Z_{\backslashrm eff}$Zeff or Z is taken as a reference sample. The values of $ Z_{\backslashrm eff}$Zeff obtained by this method agree with those obtained from the Auto-Zeff software within the stated errors. This method could be helpful in determining the effective atomic number of samples of unknown composition.
| Item Type: | Article |
|---|---|
| Subjects: | D Physical Science > Physics |
| Divisions: | Department of > Physics |
| Depositing User: | C Swapna Library Assistant |
| Date Deposited: | 21 Jun 2019 10:25 |
| Last Modified: | 21 Jun 2019 10:25 |
| URI: | http://eprints.uni-mysore.ac.in/id/eprint/3621 |
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