Hemalatha, K. and Mahadevaiah, M. and Somashekarappa, H. and Somashekar, R. (2014) Characterization of montmorillonite doped PVA/SA blends using X-ray diffraction. In: AIP Conference Proceedings.
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Official URL: https://doi.org/10.1063/1.4872767
Abstract
PVA films doped with Montmorillonite was prepared by slow evaporation technique. These films have been used to record X-ray patterns at room temperature. Correlation lengths and microstructural parameters were computed using in-house program employing X-ray data. Results show that correlation lengths as well as crystallite size increases with increase in the concentration of Montmorillonite which is inconformity with the conductivity studies.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Uncontrolled Keywords: | X ray diffraction, Microstructure, Microstructural parameters, Room temperature, Solid state physics, Clay minerals, Correlation lengths, Doped PVA, Pair correlations, Slow evaporation techniques, X ray data, X-ray patterns |
| Subjects: | D Physical Science > Physics |
| Divisions: | Department of > Physics Yuvaraj college > Physics |
| Depositing User: | Arshiya Kousar Library Assistant |
| Date Deposited: | 21 Jun 2019 05:15 |
| Last Modified: | 21 Jun 2019 05:15 |
| URI: | http://eprints.uni-mysore.ac.in/id/eprint/3489 |
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