Electron beam induced microstructural changes and electrical conductivity in bakelite rpc detector material

Kumar, K. V. A. and Ravikumar, H. B. and Ganesh, S. and Ranganathaiah, C. (2015) Electron beam induced microstructural changes and electrical conductivity in bakelite rpc detector material. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 62 (1, 2). pp. 306-313. ISSN 1558-1578

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Official URL: https://doi.org/10.1109/TNS.2014.2375916

Abstract

To explore the structural modifications in terms of crosslink density and electrical conductivity in polymer based Bakelite RPC detector material was exposed to 8 MeV electron beam with the irradiation doses of 20 kGy to 100 kGy in steps of 20 kGy. The microstructural changes of Bakelite upon electron beam irradiation have been studied using Positron Annihilation Lifetime Spectroscopy (PALS), X-ray Diffraction (XRD) and Fourier Transform Infrared (FTIR) Spectroscopy. Positron lifetime parameters viz., o-Ps lifetime and its intensity showed chain scission at lower doses (at 20 kGy and 40 kGy) followed by crosslinking due to the radical reactions. These changes are effectively explained with the help of FTIR and XRD parameters. The reduction in electrical conductivity of Bakelite material beyond 60 kGy is correlated between conducting pathways and crosslinks in the polymer matrix. The appropriate dose of electron beam on Bakelite might reduce the leakage current of Bakelite RPC detector material and hence improves the performance of the detector.

Item Type: Article
Subjects: D Physical Science > Physics
Divisions: Department of > Physics
Depositing User: Shrirekha N
Date Deposited: 17 Jun 2019 04:45
Last Modified: 17 Jun 2019 04:45
URI: http://eprints.uni-mysore.ac.in/id/eprint/2793

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