Pradhan, U. U. and Kumar, N. S. K. (2011) Characterization of titanium dioxide thin film fabricated using spin coating technique. OPTOELECTRONICS AND ADVANCED MATERIALS-RAPID COMMUNICATIONS, 5 (7). pp. 799-801.
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Abstract
Titanium dioxide films have been deposited on glass substrates by Spin Coating process. The thin film samples have been characterized for its structural and optical using Scanning Electron Microscope (SEM), Energy - Dispersive X-Ray Spectroscopy (EDAX), Ultra Violet - Visible (UV-Vis) Spectrophotometer and X-ray Diffraction (XRD).
| Item Type: | Article |
|---|---|
| Uncontrolled Keywords: | TiO2 thin film; Spin coating; Eg; SEM; EDAX |
| Subjects: | D Physical Science > Electronic |
| Divisions: | PG Centre Hassan > Electronics |
| Depositing User: | Users 23 not found. |
| Date Deposited: | 19 Jul 2019 09:57 |
| Last Modified: | 19 Jul 2019 09:57 |
| URI: | http://eprints.uni-mysore.ac.in/id/eprint/2452 |
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