X-ray photoelectron spectroscopic studies of CdS semiconductor thin films deposited by photochemical deposition

Pushpalatha, H. L. and Ganesha, R. (2015) X-ray photoelectron spectroscopic studies of CdS semiconductor thin films deposited by photochemical deposition. International Journal of ChemTech Research, 7 (5). pp. 2171-2175. ISSN 0974-4290

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Abstract

Cadmium sulphide (CdS) thin films were deposited on insulating glass substrates from an acidic solution using cadmium sulphate (CdSO4) and sodium thiosulfate (Na2S2O3) by photochemical deposition (PCD). Analysis by X-ray photoelectron spectroscopy (XPS) giving a greater insight into the chemical composition through peaks corresponding to excitation of different electronic energy levels and correlation of the calculated chemical shifts is presented in this paper

Item Type: Article
Subjects: Physical Sciences > Physics
Divisions: Constituent Colleges > Yuvaraja's College Mysore > Physics
Depositing User: Ms. Manjula p
Date Deposited: 29 Apr 2016 07:17
Last Modified: 29 Apr 2016 07:17
URI: http://eprints.uni-mysore.ac.in/id/eprint/18614

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