X-ray diffraction-line broadening analysis: Paracrystalline method

Somashekar, R. and Somashekarappa, H. (1997) X-ray diffraction-line broadening analysis: Paracrystalline method. Journal of Applied Crystallography, 30 (2). pp. 147-152. ISSN (0021-8898

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Abstract

Line-profile simulation and matching on the basis of a paracrystalline one-dimensional Hosemann model provides a promising approach to the analysis of line broadening. Results of analysis using X-ray wide-angle data of polymers and metallic samples are compared with Warren-Averbach multiple-order and single-order methods. Various column-length-distribution functions are also used for better agreement with the experimental profiles.

Item Type:	Article
Subjects:	D Physical Science > Physics
Divisions:	Department of > Physics
Depositing User:	Users 23 not found.
Date Deposited:	01 Jun 2021 06:36
Last Modified:	01 Jun 2021 06:36
URI:	http://eprints.uni-mysore.ac.in/id/eprint/16631

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