Somashekar, R. and Urs, Gopalkrishne R. (1995) Microcrystalline parameters in annealed Bivoltine silk fibres using wide-angle X-ray scattering. Polymer, 36 (10). pp. 2007-2011.
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Official URL: https://doi.org/10.1016/0032-3861(95)91445-D
Abstract
Wide-angle X-ray scattering studies of Bivoltine silk fibres have been carried out to obtain the crystal size distribution along the 201] direction. The minimum enthalpy for the formation of fibres has been estimated. The crystal size varies with annealing temperature, the values of g and alpha* remaining almost constant, which is a unique feature of Bivoltine silk fibre. Using paracrystalline statistics, the Laue pattern has been simulated employing the microstructural parameters reported in this paper.
| Item Type: | Article |
|---|---|
| Subjects: | D Physical Science > Physics |
| Divisions: | Department of > Physics |
| Depositing User: | Users 23 not found. |
| Date Deposited: | 20 May 2021 08:22 |
| Last Modified: | 16 Jul 2022 10:08 |
| URI: | http://eprints.uni-mysore.ac.in/id/eprint/16506 |
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